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postcard 16
postcard 16
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shcheka

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depthprofile1

depthprofile1

            

depthprofile1
Description: Such craters (approximately 300 nm deep) are the result of 2-4 hour sputtering of the crystal surface by rastered Cs+ ion beam during Secondary Ion Probe Spectrometry
Keywords: sims
Date: 14.12.2005 14:41
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File size: 15.8 KB
Added by: shcheka

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